量測濾餅厚度之裝置與方法

專利類型

發明

專利國別 (專利申請國家)

中華民國

專利申請案號

090106112

專利證號

I 175701

專利獲證名稱

量測濾餅厚度之裝置與方法

專利所屬機關 (申請機關)

中原大學

獲證日期

2003/04/11

技術說明

本專利中開發了非破壞性光感測量濾餅厚度之方法，可應用於懸浮粒子 在掃流過濾時於薄膜上沉積的厚度量測。其測量的精確度已用大小均一 的PMMA粒子證實。本專利所應用之探針由一端發射出紅外光打到濾餅 上，反射後由另一端的光電晶體吸收，由於光反射程度不同，讀取得的 電壓亦不同，以此計算或查表得濾餅厚度。因為這種量測方法可以即時 的紀錄濾餅厚，又不會破壞系統，比起其它已開發的方法，此方法兼具 低成本及高精確度之優點。 The effects of slurry concentration, agitating speed (i.e., slurry transport velocity), background light and color of slurry on the accuracy of measurement were examined to verify the validity of this method. The accuracy of the thickness measurements was confirmed using uniform sized PMMA spheres. Experimental results show that the developed technique is useful for cake thickness ranging from 10 to 5 mm and yields a vertical resolution as high as 10 in the same order as that of gamma-ray absorption and NMR micro-imaging methods. This method has benefits of inexpensive, easy installation and a comparable accuracy compared with gamma-ray absorption, NMR micro imaging and CATSCAN techniques. The developed method was then applied to measure the time course of cake layer thickness variation on the membrane surface during crossflow microfiltration of a PMMA suspension. Results of measurements show that the dynamic surface shape is not at all flat during a course of CFMF.

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